EVALUATION ON A TWO‐DAY TIME SCALE OF HIGH‐RELIABILITY ELECTRONIC ASSEMBLIES BY INSITU ELECTRICAL AND OPTO‐MECHANICAL TEST TECHNIQUES
- DOI
- 10.1002/(sici)1099-1638(199607)12:4<247::aid-qre22>3.3.co;2-f
- Published
- 1996-07
- Container
- Quality and Reliability Engineering International
- Publisher
- Wiley
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1002/-sici-1099-1638-199607-12:4-247::aid-qre22-3.3.co-2-f,
title = {EVALUATION ON A TWO‐DAY TIME SCALE OF HIGH‐RELIABILITY ELECTRONIC ASSEMBLIES BY INSITU ELECTRICAL AND OPTO‐MECHANICAL TEST TECHNIQUES},
author = {G. GREGORIS and F. BOUTON and C. DE KEUKELEIRE and P. SILIPRANDI and F. BAIO and L. DE SCHEPPER and W. DE CEUNINCK and L. TIELEMANS and T. AHRENS and M. KRUMM},
year = {1996},
journal = {Quality and Reliability Engineering International},
doi = {10.1002/(sici)1099-1638(199607)12:4<247::aid-qre22>3.3.co;2-f},
url = {https://doi.org/10.1002/(sici)1099-1638(199607)12:4<247::aid-qre22>3.3.co;2-f}
}RIS
TY - JOUR TI - EVALUATION ON A TWO‐DAY TIME SCALE OF HIGH‐RELIABILITY ELECTRONIC ASSEMBLIES BY INSITU ELECTRICAL AND OPTO‐MECHANICAL TEST TECHNIQUES AU - G. GREGORIS AU - F. BOUTON AU - C. DE KEUKELEIRE AU - P. SILIPRANDI AU - F. BAIO AU - L. DE SCHEPPER AU - W. DE CEUNINCK AU - L. TIELEMANS AU - T. AHRENS AU - M. KRUMM PY - 1996 JO - Quality and Reliability Engineering International DO - 10.1002/(sici)1099-1638(199607)12:4<247::aid-qre22>3.3.co;2-f UR - https://doi.org/10.1002/(sici)1099-1638(199607)12:4<247::aid-qre22>3.3.co;2-f ER -
APA
GREGORIS, G., BOUTON, F., KEUKELEIRE, C. D., SILIPRANDI, P., BAIO, F., SCHEPPER, L. D., CEUNINCK, W. D., TIELEMANS, L., AHRENS, T., & KRUMM, M. (1996). EVALUATION ON A TWO‐DAY TIME SCALE OF HIGH‐RELIABILITY ELECTRONIC ASSEMBLIES BY INSITU ELECTRICAL AND OPTO‐MECHANICAL TEST TECHNIQUES. Quality and Reliability Engineering International. https://doi.org/10.1002/(sici)1099-1638(199607)12:4<247::aid-qre22>3.3.co;2-f
Source records
- crossref · retrieved 2026-09-27T03:24:37.694Z