Low-Temperature Perovskite Crystallization Suppresses Interfacial Thermal Stress for Robust and High-Resolution Flat-Panel X-Ray Imaging.
- DOI
- 10.1002/adma.74876
- Published
- 2026 Aug 31
- Container
- Advanced materials (Deerfield Beach, Fla.)
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1002/adma.74876,
title = {Low-Temperature Perovskite Crystallization Suppresses Interfacial Thermal Stress for Robust and High-Resolution Flat-Panel X-Ray Imaging.},
author = {Wang Y and He Y and Cheng Z and Zhang Y and Yan W and Xu D and Liu S and Zhao Q and Xu X},
year = {2026},
journal = {Advanced materials (Deerfield Beach, Fla.)},
doi = {10.1002/adma.74876},
url = {https://doi.org/10.1002/adma.74876}
}RIS
TY - JOUR TI - Low-Temperature Perovskite Crystallization Suppresses Interfacial Thermal Stress for Robust and High-Resolution Flat-Panel X-Ray Imaging. AU - Wang Y AU - He Y AU - Cheng Z AU - Zhang Y AU - Yan W AU - Xu D AU - Liu S AU - Zhao Q AU - Xu X PY - 2026 JO - Advanced materials (Deerfield Beach, Fla.) DO - 10.1002/adma.74876 UR - https://doi.org/10.1002/adma.74876 ER -
APA
Y, W., Y, H., Z, C., Y, Z., W, Y., D, X., S, L., Q, Z., & X, X. (2026). Low-Temperature Perovskite Crystallization Suppresses Interfacial Thermal Stress for Robust and High-Resolution Flat-Panel X-Ray Imaging.. Advanced materials (Deerfield Beach, Fla.). https://doi.org/10.1002/adma.74876
Source records
- pubmed · retrieved 2026-09-24T19:43:24.871Z