Schottky Diode Leakage Current Fluctuations: Electrostatically Induced Flexoelectricity in Silicon

Carlos Hurtado, Melanie MacGregor, Kai Chen, Simone Ciampi

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DOI: 10.1002/advs.202403524
Published: 2024-08-09
Container: Advanced Science
Publisher: Wiley
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1002/advs.202403524,
  title = {Schottky Diode Leakage Current Fluctuations: Electrostatically Induced Flexoelectricity in Silicon},
  author = {Carlos Hurtado and Melanie MacGregor and Kai Chen and Simone Ciampi},
  year = {2024},
  journal = {Advanced Science},
  doi = {10.1002/advs.202403524},
  url = {https://doi.org/10.1002/advs.202403524}
}

RIS

TY  - JOUR
TI  - Schottky Diode Leakage Current Fluctuations: Electrostatically Induced Flexoelectricity in Silicon
AU  - Carlos Hurtado
AU  - Melanie MacGregor
AU  - Kai Chen
AU  - Simone Ciampi
PY  - 2024
JO  - Advanced Science
DO  - 10.1002/advs.202403524
UR  - https://doi.org/10.1002/advs.202403524
ER  -

APA

Hurtado, C., MacGregor, M., Chen, K., & Ciampi, S. (2024). Schottky Diode Leakage Current Fluctuations: Electrostatically Induced Flexoelectricity in Silicon. Advanced Science. https://doi.org/10.1002/advs.202403524

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crossref · retrieved 2026-11-05T07:30:37.578Z