In Situ X‐Ray Tomography and Acoustic Emission Monitoring of Damage Evolution in C/C‐SiC Composites Fabricated by Liquid Silicon Infiltration

Yang Chen, Renato S. M. Almeida, Stefan Flauder, Guillaume Couégnat, Kamen Tushtev, Jürgen Horvath, Peter Wriggers, Kurosch Rezwan

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DOI: 10.1002/advs.202516200
Published: 2025-11-13
Container: Advanced Science
Publisher: Wiley
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1002/advs.202516200,
  title = {In Situ X‐Ray Tomography and Acoustic Emission Monitoring of Damage Evolution in C/C‐SiC Composites Fabricated by Liquid Silicon Infiltration},
  author = {Yang Chen and Renato S. M. Almeida and Stefan Flauder and Guillaume Couégnat and Kamen Tushtev and Jürgen Horvath and Peter Wriggers and Kurosch Rezwan},
  year = {2025},
  journal = {Advanced Science},
  doi = {10.1002/advs.202516200},
  url = {https://doi.org/10.1002/advs.202516200}
}

RIS

TY  - JOUR
TI  - In Situ X‐Ray Tomography and Acoustic Emission Monitoring of Damage Evolution in C/C‐SiC Composites Fabricated by Liquid Silicon Infiltration
AU  - Yang Chen
AU  - Renato S. M. Almeida
AU  - Stefan Flauder
AU  - Guillaume Couégnat
AU  - Kamen Tushtev
AU  - Jürgen Horvath
AU  - Peter Wriggers
AU  - Kurosch Rezwan
PY  - 2025
JO  - Advanced Science
DO  - 10.1002/advs.202516200
UR  - https://doi.org/10.1002/advs.202516200
ER  -

APA

Chen, Y., Almeida, R. S. M., Flauder, S., Couégnat, G., Tushtev, K., Horvath, J., Wriggers, P., & Rezwan, K. (2025). In Situ X‐Ray Tomography and Acoustic Emission Monitoring of Damage Evolution in C/C‐SiC Composites Fabricated by Liquid Silicon Infiltration. Advanced Science. https://doi.org/10.1002/advs.202516200

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crossref · retrieved 2026-09-26T03:08:28.446Z