On Determination Method for Resolution of Secondary Electron Images in Scanning Electron Microscopy.

Yang T, Zou Y, Ding Z

DOI: 10.1002/advs.202519630
Published: 2026 Aug
Container: Advanced science (Weinheim, Baden-Wurttemberg, Germany)
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1002/advs.202519630,
  title = {On Determination Method for Resolution of Secondary Electron Images in Scanning Electron Microscopy.},
  author = {Yang T and Zou Y and Ding Z},
  year = {2026},
  journal = {Advanced science (Weinheim, Baden-Wurttemberg, Germany)},
  doi = {10.1002/advs.202519630},
  url = {https://doi.org/10.1002/advs.202519630}
}

RIS

TY  - JOUR
TI  - On Determination Method for Resolution of Secondary Electron Images in Scanning Electron Microscopy.
AU  - Yang T
AU  - Zou Y
AU  - Ding Z
PY  - 2026
JO  - Advanced science (Weinheim, Baden-Wurttemberg, Germany)
DO  - 10.1002/advs.202519630
UR  - https://doi.org/10.1002/advs.202519630
ER  -

APA

T, Y., Y, Z., & Z, D. (2026). On Determination Method for Resolution of Secondary Electron Images in Scanning Electron Microscopy.. Advanced science (Weinheim, Baden-Wurttemberg, Germany). https://doi.org/10.1002/advs.202519630

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pubmed · retrieved 2026-09-25T17:45:27.634Z