Synergistically Enhanced Performance and Reliability of Abrupt Metal‐Oxide Heterojunction Transistor

Pengfei Wang, Huan Yang, Jiye Li, Xiaohui Zhang, Lei Wang, Juncheng Xiao, Bin Zhao, Shengdong Zhang, Lei Lu

Open source

DOI: 10.1002/aelm.202200807
Published: 2022-10-18
Container: Advanced Electronic Materials
Publisher: Wiley
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1002/aelm.202200807,
  title = {Synergistically Enhanced Performance and Reliability of Abrupt Metal‐Oxide Heterojunction Transistor},
  author = {Pengfei Wang and Huan Yang and Jiye Li and Xiaohui Zhang and Lei Wang and Juncheng Xiao and Bin Zhao and Shengdong Zhang and Lei Lu},
  year = {2022},
  journal = {Advanced Electronic Materials},
  doi = {10.1002/aelm.202200807},
  url = {https://doi.org/10.1002/aelm.202200807}
}

RIS

TY  - JOUR
TI  - Synergistically Enhanced Performance and Reliability of Abrupt Metal‐Oxide Heterojunction Transistor
AU  - Pengfei Wang
AU  - Huan Yang
AU  - Jiye Li
AU  - Xiaohui Zhang
AU  - Lei Wang
AU  - Juncheng Xiao
AU  - Bin Zhao
AU  - Shengdong Zhang
AU  - Lei Lu
PY  - 2022
JO  - Advanced Electronic Materials
DO  - 10.1002/aelm.202200807
UR  - https://doi.org/10.1002/aelm.202200807
ER  -

APA

Wang, P., Yang, H., Li, J., Zhang, X., Wang, L., Xiao, J., Zhao, B., Zhang, S., & Lu, L. (2022). Synergistically Enhanced Performance and Reliability of Abrupt Metal‐Oxide Heterojunction Transistor. Advanced Electronic Materials. https://doi.org/10.1002/aelm.202200807

Source records

crossref · retrieved 2026-11-10T14:31:07.910Z