Surface Local Impurity Scattering as a Probe for Topological Kondo Insulators

C.‐C. Joseph Wang, Jean‐Pierre Julien, A. V. Balatsky, Jian‐Xin Zhu

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DOI: 10.1002/apxr.202500003
Published: 2025-06-23
Container: Advanced Physics Research
Publisher: Wiley
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1002/apxr.202500003,
  title = {Surface Local Impurity Scattering as a Probe for Topological Kondo Insulators},
  author = {C.‐C. Joseph Wang and Jean‐Pierre Julien and A. V. Balatsky and Jian‐Xin Zhu},
  year = {2025},
  journal = {Advanced Physics Research},
  doi = {10.1002/apxr.202500003},
  url = {https://doi.org/10.1002/apxr.202500003}
}

RIS

TY  - JOUR
TI  - Surface Local Impurity Scattering as a Probe for Topological Kondo Insulators
AU  - C.‐C. Joseph Wang
AU  - Jean‐Pierre Julien
AU  - A. V. Balatsky
AU  - Jian‐Xin Zhu
PY  - 2025
JO  - Advanced Physics Research
DO  - 10.1002/apxr.202500003
UR  - https://doi.org/10.1002/apxr.202500003
ER  -

APA

Wang, C. J., Julien, J., Balatsky, A. V., & Zhu, J. (2025). Surface Local Impurity Scattering as a Probe for Topological Kondo Insulators. Advanced Physics Research. https://doi.org/10.1002/apxr.202500003

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crossref · retrieved 2026-09-25T09:13:06.800Z