Optimal Stein‐type goodness‐of‐fit tests for count data

Christian H. Weiß, Pedro Puig, Boris Aleksandrov

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DOI: 10.1002/bimj.202200073
Published: 2022-09-27
Container: Biometrical Journal
Publisher: Wiley
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1002/bimj.202200073,
  title = {Optimal Stein‐type goodness‐of‐fit tests for count data},
  author = {Christian H. Weiß and Pedro Puig and Boris Aleksandrov},
  year = {2022},
  journal = {Biometrical Journal},
  doi = {10.1002/bimj.202200073},
  url = {https://doi.org/10.1002/bimj.202200073}
}

RIS

TY  - JOUR
TI  - Optimal Stein‐type goodness‐of‐fit tests for count data
AU  - Christian H. Weiß
AU  - Pedro Puig
AU  - Boris Aleksandrov
PY  - 2022
JO  - Biometrical Journal
DO  - 10.1002/bimj.202200073
UR  - https://doi.org/10.1002/bimj.202200073
ER  -

APA

Weiß, C. H., Puig, P., & Aleksandrov, B. (2022). Optimal Stein‐type goodness‐of‐fit tests for count data. Biometrical Journal. https://doi.org/10.1002/bimj.202200073

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crossref · retrieved 2026-09-25T13:37:00.123Z