FRET and colocalization analyzer—A method to validate measurements of sensitized emission FRET acquired by confocal microscopy and available as an ImageJ Plug‐in

Muriel Hachet‐Haas, Noël Converset, Olivier Marchal, Hans Matthes, Sophie Gioria, Jean‐Luc Galzi, Sandra Lecat

Open source

DOI
10.1002/jemt.20376
Published
2006-11
Container
Microscopy Research and Technique
Publisher
Wiley
Open access
unknown

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BibTeX

@article{allodium:10.1002/jemt.20376,
  title = {FRET and colocalization analyzer—A method to validate measurements of sensitized emission FRET acquired by confocal microscopy and available as an ImageJ Plug‐in},
  author = {Muriel Hachet‐Haas and Noël Converset and Olivier Marchal and Hans Matthes and Sophie Gioria and Jean‐Luc Galzi and Sandra Lecat},
  year = {2006},
  journal = {Microscopy Research and Technique},
  doi = {10.1002/jemt.20376},
  url = {https://doi.org/10.1002/jemt.20376}
}

RIS

TY  - JOUR
TI  - FRET and colocalization analyzer—A method to validate measurements of sensitized emission FRET acquired by confocal microscopy and available as an ImageJ Plug‐in
AU  - Muriel Hachet‐Haas
AU  - Noël Converset
AU  - Olivier Marchal
AU  - Hans Matthes
AU  - Sophie Gioria
AU  - Jean‐Luc Galzi
AU  - Sandra Lecat
PY  - 2006
JO  - Microscopy Research and Technique
DO  - 10.1002/jemt.20376
UR  - https://doi.org/10.1002/jemt.20376
ER  - 

APA

Hachet‐Haas, M., Converset, N., Marchal, O., Matthes, H., Gioria, S., Galzi, J., & Lecat, S. (2006). FRET and colocalization analyzer—A method to validate measurements of sensitized emission FRET acquired by confocal microscopy and available as an ImageJ Plug‐in. Microscopy Research and Technique. https://doi.org/10.1002/jemt.20376

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