Preparation of atom probe tips from (nano)particles in dispersion using (di)electrophoresis and electroplating

Nora Vorlaufer, Jan Josten, Simon Carl, Erik Göbel, Alexander Søgaard, Nicola Taccardi, Erdmann Spiecker, Peter Felfer

Open source

DOI: 10.1002/jemt.24448
Published: 2023-11-03
Container: Microscopy Research and Technique
Publisher: Wiley
Open access: unknown

Credibility signals

uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

supportingDOI registered: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
supportingDOI resolves: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility. Source: DOAJ; license: CC0
not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredROR affiliation: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredOpen access status: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication license: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication version: A publication version was supplied but is not scored. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
supportingMetadata completeness: All 6 scored descriptive metadata groups are present. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer

Cite this work

BibTeX

@article{allodium:10.1002/jemt.24448,
  title = {Preparation of atom probe tips from (nano)particles in dispersion using (di)electrophoresis and electroplating},
  author = {Nora Vorlaufer and Jan Josten and Simon Carl and Erik Göbel and Alexander Søgaard and Nicola Taccardi and Erdmann Spiecker and Peter Felfer},
  year = {2023},
  journal = {Microscopy Research and Technique},
  doi = {10.1002/jemt.24448},
  url = {https://doi.org/10.1002/jemt.24448}
}

RIS

TY  - JOUR
TI  - Preparation of atom probe tips from (nano)particles in dispersion using (di)electrophoresis and electroplating
AU  - Nora Vorlaufer
AU  - Jan Josten
AU  - Simon Carl
AU  - Erik Göbel
AU  - Alexander Søgaard
AU  - Nicola Taccardi
AU  - Erdmann Spiecker
AU  - Peter Felfer
PY  - 2023
JO  - Microscopy Research and Technique
DO  - 10.1002/jemt.24448
UR  - https://doi.org/10.1002/jemt.24448
ER  -

APA

Vorlaufer, N., Josten, J., Carl, S., Göbel, E., Søgaard, A., Taccardi, N., Spiecker, E., & Felfer, P. (2023). Preparation of atom probe tips from (nano)particles in dispersion using (di)electrophoresis and electroplating. Microscopy Research and Technique. https://doi.org/10.1002/jemt.24448

Source records

crossref · retrieved 2026-11-10T09:59:57.314Z