Frequency‐dependent signal and noise in spectroscopic x‐ray imaging

Jesse Tanguay, Jinwoo Kim, Ho Kyung Kim, Kris Iniewski, Ian A. Cunningham

Open source

DOI: 10.1002/mp.14160
Published: 2020-04-22
Container: Medical Physics
Publisher: Wiley
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1002/mp.14160,
  title = {Frequency‐dependent signal and noise in spectroscopic x‐ray imaging},
  author = {Jesse Tanguay and Jinwoo Kim and Ho Kyung Kim and Kris Iniewski and Ian A. Cunningham},
  year = {2020},
  journal = {Medical Physics},
  doi = {10.1002/mp.14160},
  url = {https://doi.org/10.1002/mp.14160}
}

RIS

TY  - JOUR
TI  - Frequency‐dependent signal and noise in spectroscopic x‐ray imaging
AU  - Jesse Tanguay
AU  - Jinwoo Kim
AU  - Ho Kyung Kim
AU  - Kris Iniewski
AU  - Ian A. Cunningham
PY  - 2020
JO  - Medical Physics
DO  - 10.1002/mp.14160
UR  - https://doi.org/10.1002/mp.14160
ER  -

APA

Tanguay, J., Kim, J., Kim, H. K., Iniewski, K., & Cunningham, I. A. (2020). Frequency‐dependent signal and noise in spectroscopic x‐ray imaging. Medical Physics. https://doi.org/10.1002/mp.14160

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crossref · retrieved 2026-09-26T19:04:53.294Z