Multi‐Environment Genomic Analysis Reveals Limited Concordance Between Sorghum Leaf Blight Incidence and Severity
- DOI
- 10.1002/pei3.70214
- Published
- 2026-11-02
- Container
- Plant-Environment Interactions
- Publisher
- Wiley
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1002/pei3.70214,
title = {Multi‐Environment Genomic Analysis Reveals Limited Concordance Between Sorghum Leaf Blight Incidence and Severity},
author = {Ezekiel Ahn and Insuck Baek and Louis K. Prom and Moon S. Kim and Lyndel W. Meinhardt and Clint Magill},
year = {2026},
journal = {Plant-Environment Interactions},
doi = {10.1002/pei3.70214},
url = {https://doi.org/10.1002/pei3.70214}
}RIS
TY - JOUR TI - Multi‐Environment Genomic Analysis Reveals Limited Concordance Between Sorghum Leaf Blight Incidence and Severity AU - Ezekiel Ahn AU - Insuck Baek AU - Louis K. Prom AU - Moon S. Kim AU - Lyndel W. Meinhardt AU - Clint Magill PY - 2026 JO - Plant-Environment Interactions DO - 10.1002/pei3.70214 UR - https://doi.org/10.1002/pei3.70214 ER -
APA
Ahn, E., Baek, I., Prom, L. K., Kim, M. S., Meinhardt, L. W., & Magill, C. (2026). Multi‐Environment Genomic Analysis Reveals Limited Concordance Between Sorghum Leaf Blight Incidence and Severity. Plant-Environment Interactions. https://doi.org/10.1002/pei3.70214
Source records
- crossref · retrieved 2026-11-06T07:45:01.847Z