Electrical in‐situ characterisation of interface stabilised organic thin‐film transistors
- DOI
- 10.1002/pssr.201510169
- Published
- 2015-07
- Container
- physica status solidi (RRL) – Rapid Research Letters
- Publisher
- Wiley
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1002/pssr.201510169,
title = {Electrical in‐situ characterisation of interface stabilised organic thin‐film transistors},
author = {Bernd Striedinger and Alexander Fian and Andreas Petritz and Roman Lassnig and Adolf Winkler and Barbara Stadlober},
year = {2015},
journal = {physica status solidi (RRL) – Rapid Research Letters},
doi = {10.1002/pssr.201510169},
url = {https://doi.org/10.1002/pssr.201510169}
}RIS
TY - JOUR TI - Electrical in‐situ characterisation of interface stabilised organic thin‐film transistors AU - Bernd Striedinger AU - Alexander Fian AU - Andreas Petritz AU - Roman Lassnig AU - Adolf Winkler AU - Barbara Stadlober PY - 2015 JO - physica status solidi (RRL) – Rapid Research Letters DO - 10.1002/pssr.201510169 UR - https://doi.org/10.1002/pssr.201510169 ER -
APA
Striedinger, B., Fian, A., Petritz, A., Lassnig, R., Winkler, A., & Stadlober, B. (2015). Electrical in‐situ characterisation of interface stabilised organic thin‐film transistors. physica status solidi (RRL) – Rapid Research Letters. https://doi.org/10.1002/pssr.201510169
Source records
- crossref · retrieved 2026-09-26T20:02:10.183Z