Sensitivity Enhancement by Dual Deflection Electrodes in an Electrospray Ionization Source.

Date M, Kumano S, Sugiyama M, Hasegawa H, Watanabe M

DOI: 10.1002/rcm.70159
Published: 2026 Nov 15
Container: Rapid communications in mass spectrometry : RCM
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1002/rcm.70159,
  title = {Sensitivity Enhancement by Dual Deflection Electrodes in an Electrospray Ionization Source.},
  author = {Date M and Kumano S and Sugiyama M and Hasegawa H and Watanabe M},
  year = {2026},
  journal = {Rapid communications in mass spectrometry : RCM},
  doi = {10.1002/rcm.70159},
  url = {https://doi.org/10.1002/rcm.70159}
}

RIS

TY  - JOUR
TI  - Sensitivity Enhancement by Dual Deflection Electrodes in an Electrospray Ionization Source.
AU  - Date M
AU  - Kumano S
AU  - Sugiyama M
AU  - Hasegawa H
AU  - Watanabe M
PY  - 2026
JO  - Rapid communications in mass spectrometry : RCM
DO  - 10.1002/rcm.70159
UR  - https://doi.org/10.1002/rcm.70159
ER  -

APA

M, D., S, K., M, S., H, H., & M, W. (2026). Sensitivity Enhancement by Dual Deflection Electrodes in an Electrospray Ionization Source.. Rapid communications in mass spectrometry : RCM. https://doi.org/10.1002/rcm.70159

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pubmed · retrieved 2026-09-25T08:57:14.050Z