Depth profiling cross-linked poly(methyl methacrylate) films: a time-of-flight secondary ion mass spectrometry approach.

Naderi-Gohar S, Huang KM, Wu Y, Lau WM, Nie HY

Open source

DOI
10.1002/rcm.7801
Published
2017 Feb 28
Container
Rapid communications in mass spectrometry : RCM
Publisher
Not recorded
Open access
unknown

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BibTeX

@article{allodium:10.1002/rcm.7801,
  title = {Depth profiling cross-linked poly(methyl methacrylate) films: a time-of-flight secondary ion mass spectrometry approach.},
  author = {Naderi-Gohar S and Huang KM and Wu Y and Lau WM and Nie HY},
  year = {2017},
  journal = {Rapid communications in mass spectrometry : RCM},
  doi = {10.1002/rcm.7801},
  url = {https://doi.org/10.1002/rcm.7801}
}

RIS

TY  - JOUR
TI  - Depth profiling cross-linked poly(methyl methacrylate) films: a time-of-flight secondary ion mass spectrometry approach.
AU  - Naderi-Gohar S
AU  - Huang KM
AU  - Wu Y
AU  - Lau WM
AU  - Nie HY
PY  - 2017
JO  - Rapid communications in mass spectrometry : RCM
DO  - 10.1002/rcm.7801
UR  - https://doi.org/10.1002/rcm.7801
ER  - 

APA

S, N., KM, H., Y, W., WM, L., & HY, N. (2017). Depth profiling cross-linked poly(methyl methacrylate) films: a time-of-flight secondary ion mass spectrometry approach.. Rapid communications in mass spectrometry : RCM. https://doi.org/10.1002/rcm.7801

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