Depth profiling cross-linked poly(methyl methacrylate) films: a time-of-flight secondary ion mass spectrometry approach.
- DOI
- 10.1002/rcm.7801
- Published
- 2017 Feb 28
- Container
- Rapid communications in mass spectrometry : RCM
- Publisher
- Not recorded
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1002/rcm.7801,
title = {Depth profiling cross-linked poly(methyl methacrylate) films: a time-of-flight secondary ion mass spectrometry approach.},
author = {Naderi-Gohar S and Huang KM and Wu Y and Lau WM and Nie HY},
year = {2017},
journal = {Rapid communications in mass spectrometry : RCM},
doi = {10.1002/rcm.7801},
url = {https://doi.org/10.1002/rcm.7801}
}RIS
TY - JOUR TI - Depth profiling cross-linked poly(methyl methacrylate) films: a time-of-flight secondary ion mass spectrometry approach. AU - Naderi-Gohar S AU - Huang KM AU - Wu Y AU - Lau WM AU - Nie HY PY - 2017 JO - Rapid communications in mass spectrometry : RCM DO - 10.1002/rcm.7801 UR - https://doi.org/10.1002/rcm.7801 ER -
APA
S, N., KM, H., Y, W., WM, L., & HY, N. (2017). Depth profiling cross-linked poly(methyl methacrylate) films: a time-of-flight secondary ion mass spectrometry approach.. Rapid communications in mass spectrometry : RCM. https://doi.org/10.1002/rcm.7801
Source records
- pubmed · retrieved 2026-09-27T07:21:49.682Z