Depth profiling and standardization from the back side of a sample for accurate analyses: Emphasis on quantifying low-fluence, shallow implants in diamond-like carbon.
- DOI
- 10.1002/rcm.9454
- Published
- 2023 Mar 30
- Container
- Rapid communications in mass spectrometry : RCM
- Publisher
- Not recorded
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.1002/rcm.9454,
title = {Depth profiling and standardization from the back side of a sample for accurate analyses: Emphasis on quantifying low-fluence, shallow implants in diamond-like carbon.},
author = {Rieck KD and Jurewicz AJG and Hervig RL and Williams P and Olinger CT and Wiens RC and Ogliore RC},
year = {2023},
journal = {Rapid communications in mass spectrometry : RCM},
doi = {10.1002/rcm.9454},
url = {https://doi.org/10.1002/rcm.9454}
}RIS
TY - JOUR TI - Depth profiling and standardization from the back side of a sample for accurate analyses: Emphasis on quantifying low-fluence, shallow implants in diamond-like carbon. AU - Rieck KD AU - Jurewicz AJG AU - Hervig RL AU - Williams P AU - Olinger CT AU - Wiens RC AU - Ogliore RC PY - 2023 JO - Rapid communications in mass spectrometry : RCM DO - 10.1002/rcm.9454 UR - https://doi.org/10.1002/rcm.9454 ER -
APA
KD, R., AJG, J., RL, H., P, W., CT, O., RC, W., & RC, O. (2023). Depth profiling and standardization from the back side of a sample for accurate analyses: Emphasis on quantifying low-fluence, shallow implants in diamond-like carbon.. Rapid communications in mass spectrometry : RCM. https://doi.org/10.1002/rcm.9454
Source records
- pubmed · retrieved 2026-09-26T16:46:49.490Z