Robust Material Properties in Epitaxial In(2)Te(3) Thin Films across Varying Thicknesses.

Buchta M, Hoff F, Bothe L, Penner N, Ringkamp C, Schmidt T, Köttgen J, Veslin T, Mak KL, Frank J, Kim D, Wuttig M

DOI: 10.1002/smll.202508738
Published: 2025 Dec
Container: Small (Weinheim an der Bergstrasse, Germany)
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1002/smll.202508738,
  title = {Robust Material Properties in Epitaxial In(2)Te(3) Thin Films across Varying Thicknesses.},
  author = {Buchta M and Hoff F and Bothe L and Penner N and Ringkamp C and Schmidt T and Köttgen J and Veslin T and Mak KL and Frank J and Kim D and Wuttig M},
  year = {2025},
  journal = {Small (Weinheim an der Bergstrasse, Germany)},
  doi = {10.1002/smll.202508738},
  url = {https://doi.org/10.1002/smll.202508738}
}

RIS

TY  - JOUR
TI  - Robust Material Properties in Epitaxial In(2)Te(3) Thin Films across Varying Thicknesses.
AU  - Buchta M
AU  - Hoff F
AU  - Bothe L
AU  - Penner N
AU  - Ringkamp C
AU  - Schmidt T
AU  - Köttgen J
AU  - Veslin T
AU  - Mak KL
AU  - Frank J
AU  - Kim D
AU  - Wuttig M
PY  - 2025
JO  - Small (Weinheim an der Bergstrasse, Germany)
DO  - 10.1002/smll.202508738
UR  - https://doi.org/10.1002/smll.202508738
ER  -

APA

M, B., F, H., L, B., N, P., C, R., T, S., J, K., T, V., KL, M., J, F., D, K., & M, W. (2025). Robust Material Properties in Epitaxial In(2)Te(3) Thin Films across Varying Thicknesses.. Small (Weinheim an der Bergstrasse, Germany). https://doi.org/10.1002/smll.202508738

Source records

pubmed · retrieved 2026-09-26T00:48:27.809Z