Advanced Characterization of Soft Cosmetic Film Deposits with X-Ray Microtomography.

Gonçalves M, Han Y, Baek HS, Song C, Weon BM

DOI: 10.1002/smtd.202402202
Published: 2026 Jan
Container: Small methods
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1002/smtd.202402202,
  title = {Advanced Characterization of Soft Cosmetic Film Deposits with X-Ray Microtomography.},
  author = {Gonçalves M and Han Y and Baek HS and Song C and Weon BM},
  year = {2026},
  journal = {Small methods},
  doi = {10.1002/smtd.202402202},
  url = {https://doi.org/10.1002/smtd.202402202}
}

RIS

TY  - JOUR
TI  - Advanced Characterization of Soft Cosmetic Film Deposits with X-Ray Microtomography.
AU  - Gonçalves M
AU  - Han Y
AU  - Baek HS
AU  - Song C
AU  - Weon BM
PY  - 2026
JO  - Small methods
DO  - 10.1002/smtd.202402202
UR  - https://doi.org/10.1002/smtd.202402202
ER  -

APA

M, G., Y, H., HS, B., C, S., & BM, W. (2026). Advanced Characterization of Soft Cosmetic Film Deposits with X-Ray Microtomography.. Small methods. https://doi.org/10.1002/smtd.202402202

Source records

pubmed · retrieved 2026-09-25T01:53:33.866Z