Comparison of wavelength‐dispersive X‐ray fluorescence spectrometry and inductively coupled plasma optical emission spectrometry for the elementary determination in plants through the accuracy profile method
- DOI
- 10.1002/xrs.2840
- Published
- 2018-04-19
- Container
- X-Ray Spectrometry
- Publisher
- Wiley
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1002/xrs.2840,
title = {Comparison of wavelength‐dispersive X‐ray fluorescence spectrometry and inductively coupled plasma optical emission spectrometry for the elementary determination in plants through the accuracy profile method},
author = {Pierre Masson and Thierry Dalix and Guillaume Daugey and Patrice Soulé},
year = {2018},
journal = {X-Ray Spectrometry},
doi = {10.1002/xrs.2840},
url = {https://doi.org/10.1002/xrs.2840}
}RIS
TY - JOUR TI - Comparison of wavelength‐dispersive X‐ray fluorescence spectrometry and inductively coupled plasma optical emission spectrometry for the elementary determination in plants through the accuracy profile method AU - Pierre Masson AU - Thierry Dalix AU - Guillaume Daugey AU - Patrice Soulé PY - 2018 JO - X-Ray Spectrometry DO - 10.1002/xrs.2840 UR - https://doi.org/10.1002/xrs.2840 ER -
APA
Masson, P., Dalix, T., Daugey, G., & Soulé, P. (2018). Comparison of wavelength‐dispersive X‐ray fluorescence spectrometry and inductively coupled plasma optical emission spectrometry for the elementary determination in plants through the accuracy profile method. X-Ray Spectrometry. https://doi.org/10.1002/xrs.2840
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- crossref · retrieved 2026-09-25T07:59:08.062Z