Comparison of wavelength‐dispersive X‐ray fluorescence spectrometry and inductively coupled plasma optical emission spectrometry for the elementary determination in plants through the accuracy profile method

Pierre Masson, Thierry Dalix, Guillaume Daugey, Patrice Soulé

Open source

DOI
10.1002/xrs.2840
Published
2018-04-19
Container
X-Ray Spectrometry
Publisher
Wiley
Open access
unknown

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BibTeX

@article{allodium:10.1002/xrs.2840,
  title = {Comparison of wavelength‐dispersive X‐ray fluorescence spectrometry and inductively coupled plasma optical emission spectrometry for the elementary determination in plants through the accuracy profile method},
  author = {Pierre Masson and Thierry Dalix and Guillaume Daugey and Patrice Soulé},
  year = {2018},
  journal = {X-Ray Spectrometry},
  doi = {10.1002/xrs.2840},
  url = {https://doi.org/10.1002/xrs.2840}
}

RIS

TY  - JOUR
TI  - Comparison of wavelength‐dispersive X‐ray fluorescence spectrometry and inductively coupled plasma optical emission spectrometry for the elementary determination in plants through the accuracy profile method
AU  - Pierre Masson
AU  - Thierry Dalix
AU  - Guillaume Daugey
AU  - Patrice Soulé
PY  - 2018
JO  - X-Ray Spectrometry
DO  - 10.1002/xrs.2840
UR  - https://doi.org/10.1002/xrs.2840
ER  - 

APA

Masson, P., Dalix, T., Daugey, G., & Soulé, P. (2018). Comparison of wavelength‐dispersive X‐ray fluorescence spectrometry and inductively coupled plasma optical emission spectrometry for the elementary determination in plants through the accuracy profile method. X-Ray Spectrometry. https://doi.org/10.1002/xrs.2840

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