Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT and Test Set Perspectives
- DOI
- 10.1007/11556930_55
- Published
- 2005
- Container
- Lecture Notes in Computer Science
- Publisher
- Springer Berlin Heidelberg
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1007/11556930_55,
title = {Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT and Test Set Perspectives},
author = {Nabil Badereddine and Patrick Girard and Arnaud Virazel and Serge Pravossoudovitch and Christian Landrault},
year = {2005},
journal = {Lecture Notes in Computer Science},
doi = {10.1007/11556930_55},
url = {https://doi.org/10.1007/11556930_55}
}RIS
TY - JOUR TI - Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT and Test Set Perspectives AU - Nabil Badereddine AU - Patrick Girard AU - Arnaud Virazel AU - Serge Pravossoudovitch AU - Christian Landrault PY - 2005 JO - Lecture Notes in Computer Science DO - 10.1007/11556930_55 UR - https://doi.org/10.1007/11556930_55 ER -
APA
Badereddine, N., Girard, P., Virazel, A., Pravossoudovitch, S., & Landrault, C. (2005). Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT and Test Set Perspectives. Lecture Notes in Computer Science. https://doi.org/10.1007/11556930_55
Source records
- crossref · retrieved 2026-11-04T12:24:11.764Z