On Test Generation for Microprocessors for Extended Class of Functional Faults
- DOI
- 10.1007/978-3-030-53273-4_2
- Published
- 2020
- Container
- IFIP Advances in Information and Communication Technology
- Publisher
- Springer International Publishing
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1007/978-3-030-53273-4_2,
title = {On Test Generation for Microprocessors for Extended Class of Functional Faults},
author = {Adeboye Stephen Oyeniran and Raimund Ubar and Maksim Jenihhin and Jaan Raik},
year = {2020},
journal = {IFIP Advances in Information and Communication Technology},
doi = {10.1007/978-3-030-53273-4_2},
url = {https://doi.org/10.1007/978-3-030-53273-4_2}
}RIS
TY - JOUR TI - On Test Generation for Microprocessors for Extended Class of Functional Faults AU - Adeboye Stephen Oyeniran AU - Raimund Ubar AU - Maksim Jenihhin AU - Jaan Raik PY - 2020 JO - IFIP Advances in Information and Communication Technology DO - 10.1007/978-3-030-53273-4_2 UR - https://doi.org/10.1007/978-3-030-53273-4_2 ER -
APA
Oyeniran, A. S., Ubar, R., Jenihhin, M., & Raik, J. (2020). On Test Generation for Microprocessors for Extended Class of Functional Faults. IFIP Advances in Information and Communication Technology. https://doi.org/10.1007/978-3-030-53273-4_2
Source records
- crossref · retrieved 2026-09-25T17:41:46.509Z