Topological Data Analysis of Time-Series as an Input Embedding for Deep Learning Models

Morgan Byers, Lee B. Hinkle, Vangelis Metsis

Open source

DOI
10.1007/978-3-031-08337-2_33
Published
2022
Container
IFIP Advances in Information and Communication Technology
Publisher
Springer International Publishing
Open access
unknown

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BibTeX

@article{allodium:10.1007/978-3-031-08337-2_33,
  title = {Topological Data Analysis of Time-Series as an Input Embedding for Deep Learning Models},
  author = {Morgan Byers and Lee B. Hinkle and Vangelis Metsis},
  year = {2022},
  journal = {IFIP Advances in Information and Communication Technology},
  doi = {10.1007/978-3-031-08337-2_33},
  url = {https://doi.org/10.1007/978-3-031-08337-2_33}
}

RIS

TY  - JOUR
TI  - Topological Data Analysis of Time-Series as an Input Embedding for Deep Learning Models
AU  - Morgan Byers
AU  - Lee B. Hinkle
AU  - Vangelis Metsis
PY  - 2022
JO  - IFIP Advances in Information and Communication Technology
DO  - 10.1007/978-3-031-08337-2_33
UR  - https://doi.org/10.1007/978-3-031-08337-2_33
ER  - 

APA

Byers, M., Hinkle, L. B., & Metsis, V. (2022). Topological Data Analysis of Time-Series as an Input Embedding for Deep Learning Models. IFIP Advances in Information and Communication Technology. https://doi.org/10.1007/978-3-031-08337-2_33

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