Determining Thin Film Characteristics by Prism Coupling Technique
- DOI
- 10.1007/978-3-031-63851-0_24
- Published
- 2024
- Container
- IFIP Advances in Information and Communication Technology
- Publisher
- Springer Nature Switzerland
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1007/978-3-031-63851-0_24,
title = {Determining Thin Film Characteristics by Prism Coupling Technique},
author = {Paulo Lourenço and Yuri Vygranenko and João Costa and Miguel Fernandes and Alessandro Fantoni and Manuela Vieira and G. Lavareda},
year = {2024},
journal = {IFIP Advances in Information and Communication Technology},
doi = {10.1007/978-3-031-63851-0_24},
url = {https://doi.org/10.1007/978-3-031-63851-0_24}
}RIS
TY - JOUR TI - Determining Thin Film Characteristics by Prism Coupling Technique AU - Paulo Lourenço AU - Yuri Vygranenko AU - João Costa AU - Miguel Fernandes AU - Alessandro Fantoni AU - Manuela Vieira AU - G. Lavareda PY - 2024 JO - IFIP Advances in Information and Communication Technology DO - 10.1007/978-3-031-63851-0_24 UR - https://doi.org/10.1007/978-3-031-63851-0_24 ER -
APA
Lourenço, P., Vygranenko, Y., Costa, J., Fernandes, M., Fantoni, A., Vieira, M., & Lavareda, G. (2024). Determining Thin Film Characteristics by Prism Coupling Technique. IFIP Advances in Information and Communication Technology. https://doi.org/10.1007/978-3-031-63851-0_24
Source records
- crossref · retrieved 2026-09-26T05:46:08.185Z