Construct an Intelligent Yield Alert and Diagnostic Analysis System via Data Analysis: Empirical Study of a Semiconductor Foundry
- DOI
- 10.1007/978-3-319-99707-0_49
- Published
- 2018
- Container
- IFIP Advances in Information and Communication Technology
- Publisher
- Springer International Publishing
- Open access
- unknown
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uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
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Cite this work
BibTeX
@article{allodium:10.1007/978-3-319-99707-0_49,
title = {Construct an Intelligent Yield Alert and Diagnostic Analysis System via Data Analysis: Empirical Study of a Semiconductor Foundry},
author = {Yi-Jyun Chen and Yen-Han Lee and Ming-Chuan Chiu},
year = {2018},
journal = {IFIP Advances in Information and Communication Technology},
doi = {10.1007/978-3-319-99707-0_49},
url = {https://doi.org/10.1007/978-3-319-99707-0_49}
}RIS
TY - JOUR TI - Construct an Intelligent Yield Alert and Diagnostic Analysis System via Data Analysis: Empirical Study of a Semiconductor Foundry AU - Yi-Jyun Chen AU - Yen-Han Lee AU - Ming-Chuan Chiu PY - 2018 JO - IFIP Advances in Information and Communication Technology DO - 10.1007/978-3-319-99707-0_49 UR - https://doi.org/10.1007/978-3-319-99707-0_49 ER -
APA
Chen, Y., Lee, Y., & Chiu, M. (2018). Construct an Intelligent Yield Alert and Diagnostic Analysis System via Data Analysis: Empirical Study of a Semiconductor Foundry. IFIP Advances in Information and Communication Technology. https://doi.org/10.1007/978-3-319-99707-0_49
Source records
- crossref · retrieved 2026-09-26T09:17:09.789Z