Unified built-in self-test for fully differential analog circuits

S. Mir, M. Lubaszewski, B. Courtois

Open source

DOI: 10.1007/bf00137570
Published: 1996
Container: Journal of Electronic Testing
Publisher: Springer Science and Business Media LLC
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1007/bf00137570,
  title = {Unified built-in self-test for fully differential analog circuits},
  author = {S. Mir and M. Lubaszewski and B. Courtois},
  year = {1996},
  journal = {Journal of Electronic Testing},
  doi = {10.1007/bf00137570},
  url = {https://doi.org/10.1007/bf00137570}
}

RIS

TY  - JOUR
TI  - Unified built-in self-test for fully differential analog circuits
AU  - S. Mir
AU  - M. Lubaszewski
AU  - B. Courtois
PY  - 1996
JO  - Journal of Electronic Testing
DO  - 10.1007/bf00137570
UR  - https://doi.org/10.1007/bf00137570
ER  -

APA

Mir, S., Lubaszewski, M., & Courtois, B. (1996). Unified built-in self-test for fully differential analog circuits. Journal of Electronic Testing. https://doi.org/10.1007/bf00137570

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crossref · retrieved 2026-09-25T07:55:50.923Z