Computer vision-assisted analysis of Ni-electroplated diamond wire wear and its effect on polycrystalline silicon sawn surface
- DOI
- 10.1007/s00170-026-17634-4
- Published
- 2026-03-03
- Container
- International Journal of Advanced Manufacturing Technology
- Publisher
- Not recorded
- Open access
- yes
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Cite this work
BibTeX
@article{allodium:10.1007/s00170-026-17634-4,
title = {Computer vision-assisted analysis of Ni-electroplated diamond wire wear and its effect on polycrystalline silicon sawn surface},
author = {Erick Cardoso Costa and Eduardo de Souza Ronsoni and Natalie Souza Heinz and Ricardo Knoblauch and Fabio Antonio Xavier},
year = {2026},
journal = {International Journal of Advanced Manufacturing Technology},
doi = {10.1007/s00170-026-17634-4},
url = {https://doi.org/10.1007/s00170-026-17634-4}
}RIS
TY - JOUR TI - Computer vision-assisted analysis of Ni-electroplated diamond wire wear and its effect on polycrystalline silicon sawn surface AU - Erick Cardoso Costa AU - Eduardo de Souza Ronsoni AU - Natalie Souza Heinz AU - Ricardo Knoblauch AU - Fabio Antonio Xavier PY - 2026 JO - International Journal of Advanced Manufacturing Technology DO - 10.1007/s00170-026-17634-4 UR - https://doi.org/10.1007/s00170-026-17634-4 ER -
APA
Costa, E. C., Ronsoni, E. D. S., Heinz, N. S., Knoblauch, R., & Xavier, F. A. (2026). Computer vision-assisted analysis of Ni-electroplated diamond wire wear and its effect on polycrystalline silicon sawn surface. International Journal of Advanced Manufacturing Technology. https://doi.org/10.1007/s00170-026-17634-4
Source records
- hal · retrieved 2026-09-27T04:00:48.381Z