Deep learning based load station inspection for smart manufacturing with limited data

Yasir Ijaz, Sonya Coleman, Dermot Kerr, Nazmul Siddique, Cormac McAteer, Bryan Baker, Khoi Nguyen

Open source

DOI: 10.1007/s00170-026-18606-4
Published: 2026-07
Container: The International Journal of Advanced Manufacturing Technology
Publisher: Springer Science and Business Media LLC
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1007/s00170-026-18606-4,
  title = {Deep learning based load station inspection for smart manufacturing with limited data},
  author = {Yasir Ijaz and Sonya Coleman and Dermot Kerr and Nazmul Siddique and Cormac McAteer and Bryan Baker and Khoi Nguyen},
  year = {2026},
  journal = {The International Journal of Advanced Manufacturing Technology},
  doi = {10.1007/s00170-026-18606-4},
  url = {https://doi.org/10.1007/s00170-026-18606-4}
}

RIS

TY  - JOUR
TI  - Deep learning based load station inspection for smart manufacturing with limited data
AU  - Yasir Ijaz
AU  - Sonya Coleman
AU  - Dermot Kerr
AU  - Nazmul Siddique
AU  - Cormac McAteer
AU  - Bryan Baker
AU  - Khoi Nguyen
PY  - 2026
JO  - The International Journal of Advanced Manufacturing Technology
DO  - 10.1007/s00170-026-18606-4
UR  - https://doi.org/10.1007/s00170-026-18606-4
ER  -

APA

Ijaz, Y., Coleman, S., Kerr, D., Siddique, N., McAteer, C., Baker, B., & Nguyen, K. (2026). Deep learning based load station inspection for smart manufacturing with limited data. The International Journal of Advanced Manufacturing Technology. https://doi.org/10.1007/s00170-026-18606-4

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crossref · retrieved 2026-09-25T13:44:21.677Z