RETRACTED ARTICLE: Structural, optical and electrical characterization of vacuum-evaporated nanocrystalline CdSe thin films for photosensor applications

Vipin Kumar, D. K. Sharma, Kapil Sharma, D. K. Dwivedi

DOI: 10.1007/s00339-016-0502-0
Published: 2016-10-18
Container: Applied Physics A
Publisher: Springer Science and Business Media LLC
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1007/s00339-016-0502-0,
  title = {RETRACTED ARTICLE: Structural, optical and electrical characterization of vacuum-evaporated nanocrystalline CdSe thin films for photosensor applications},
  author = {Vipin Kumar and D. K. Sharma and Kapil Sharma and D. K. Dwivedi},
  year = {2016},
  journal = {Applied Physics A},
  doi = {10.1007/s00339-016-0502-0},
  url = {https://doi.org/10.1007/s00339-016-0502-0}
}

RIS

TY  - JOUR
TI  - RETRACTED ARTICLE: Structural, optical and electrical characterization of vacuum-evaporated nanocrystalline CdSe thin films for photosensor applications
AU  - Vipin Kumar
AU  - D. K. Sharma
AU  - Kapil Sharma
AU  - D. K. Dwivedi
PY  - 2016
JO  - Applied Physics A
DO  - 10.1007/s00339-016-0502-0
UR  - https://doi.org/10.1007/s00339-016-0502-0
ER  -

APA

Kumar, V., Sharma, D. K., Sharma, K., & Dwivedi, D. K. (2016). RETRACTED ARTICLE: Structural, optical and electrical characterization of vacuum-evaporated nanocrystalline CdSe thin films for photosensor applications. Applied Physics A. https://doi.org/10.1007/s00339-016-0502-0

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crossref · retrieved 2026-11-07T05:58:42.773Z