Mental-Fatigue-Related Changes in EEG Microstate Dynamics and Microstate-Conditioned Phase-Amplitude Coupling

Mingxiu Han, Yuwen Wang, Hao Liu, Haijun Niu, Zhongtao Hu, Tao Liu

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DOI
10.1007/s10439-026-04436-8
Published
2026-11-05
Container
Annals of Biomedical Engineering
Publisher
Springer Science and Business Media LLC
Open access
unknown

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BibTeX

@article{allodium:10.1007/s10439-026-04436-8,
  title = {Mental-Fatigue-Related Changes in EEG Microstate Dynamics and Microstate-Conditioned Phase-Amplitude Coupling},
  author = {Mingxiu Han and Yuwen Wang and Hao Liu and Haijun Niu and Zhongtao Hu and Tao Liu},
  year = {2026},
  journal = {Annals of Biomedical Engineering},
  doi = {10.1007/s10439-026-04436-8},
  url = {https://doi.org/10.1007/s10439-026-04436-8}
}

RIS

TY  - JOUR
TI  - Mental-Fatigue-Related Changes in EEG Microstate Dynamics and Microstate-Conditioned Phase-Amplitude Coupling
AU  - Mingxiu Han
AU  - Yuwen Wang
AU  - Hao Liu
AU  - Haijun Niu
AU  - Zhongtao Hu
AU  - Tao Liu
PY  - 2026
JO  - Annals of Biomedical Engineering
DO  - 10.1007/s10439-026-04436-8
UR  - https://doi.org/10.1007/s10439-026-04436-8
ER  - 

APA

Han, M., Wang, Y., Liu, H., Niu, H., Hu, Z., & Liu, T. (2026). Mental-Fatigue-Related Changes in EEG Microstate Dynamics and Microstate-Conditioned Phase-Amplitude Coupling. Annals of Biomedical Engineering. https://doi.org/10.1007/s10439-026-04436-8

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