Finite element modeling to analyze TEER values across silicon nanomembranes.

Khire TS, Nehilla BJ, Getpreecharsawas J, Gracheva ME, Waugh RE, McGrath JL

DOI: 10.1007/s10544-017-0251-7
Published: 2018 Jan 5
Container: Biomedical microdevices
Publisher: Not recorded
Open access: yes

Credibility signals

limited evidence Score 45/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

cautionDOI registered: No matching Crossref record was present in this response. Source: Crossref; license: CC0 metadata
cautionDOI resolves: No matching Crossref record was present in this response. Source: Crossref; license: CC0 metadata
not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility. Source: DOAJ; license: CC0
not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredROR affiliation: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
supportingOpen access status: Normalized open-access status: open. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
not scoredPublication license: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication version: A publication version was supplied but is not scored. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
cautionMetadata completeness: 5 of 6 scored descriptive metadata groups are present; missing fields increase uncertainty. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer

Cite this work

BibTeX

@article{allodium:10.1007/s10544-017-0251-7,
  title = {Finite element modeling to analyze TEER values across silicon nanomembranes.},
  author = {Khire TS and Nehilla BJ and Getpreecharsawas J and Gracheva ME and Waugh RE and McGrath JL},
  year = {2018},
  journal = {Biomedical microdevices},
  doi = {10.1007/s10544-017-0251-7},
  url = {https://doi.org/10.1007/s10544-017-0251-7}
}

RIS

TY  - JOUR
TI  - Finite element modeling to analyze TEER values across silicon nanomembranes.
AU  - Khire TS
AU  - Nehilla BJ
AU  - Getpreecharsawas J
AU  - Gracheva ME
AU  - Waugh RE
AU  - McGrath JL
PY  - 2018
JO  - Biomedical microdevices
DO  - 10.1007/s10544-017-0251-7
UR  - https://doi.org/10.1007/s10544-017-0251-7
ER  -

APA

TS, K., BJ, N., J, G., ME, G., RE, W., & JL, M. (2018). Finite element modeling to analyze TEER values across silicon nanomembranes.. Biomedical microdevices. https://doi.org/10.1007/s10544-017-0251-7

Source records

pubmed · retrieved 2026-09-26T20:59:57.900Z