A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction
- DOI
- 10.1007/s10836-007-5053-z
- Published
- 2008-01-17
- Container
- Journal of Electronic Testing
- Publisher
- Springer Science and Business Media LLC
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1007/s10836-007-5053-z,
title = {A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction},
author = {N. Badereddine and Z. Wang and P. Girard and K. Chakrabarty and A. Virazel and S. Pravossoudovitch and C. Landrault},
year = {2008},
journal = {Journal of Electronic Testing},
doi = {10.1007/s10836-007-5053-z},
url = {https://doi.org/10.1007/s10836-007-5053-z}
}RIS
TY - JOUR TI - A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction AU - N. Badereddine AU - Z. Wang AU - P. Girard AU - K. Chakrabarty AU - A. Virazel AU - S. Pravossoudovitch AU - C. Landrault PY - 2008 JO - Journal of Electronic Testing DO - 10.1007/s10836-007-5053-z UR - https://doi.org/10.1007/s10836-007-5053-z ER -
APA
Badereddine, N., Wang, Z., Girard, P., Chakrabarty, K., Virazel, A., Pravossoudovitch, S., & Landrault, C. (2008). A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction. Journal of Electronic Testing. https://doi.org/10.1007/s10836-007-5053-z
Source records
- crossref · retrieved 2026-11-10T17:58:10.299Z