On the Test and Mitigation of Malfunctions in Low-Power SRAMs

L. H. Bonet Zordan, A. Bosio, L. Dilillo, P. Girard, A. Virazel, N. Badereddine

Open source

DOI: 10.1007/s10836-014-5479-z
Published: 2014-10
Container: Journal of Electronic Testing
Publisher: Springer Science and Business Media LLC
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1007/s10836-014-5479-z,
  title = {On the Test and Mitigation of Malfunctions in Low-Power SRAMs},
  author = {L. H. Bonet Zordan and A. Bosio and L. Dilillo and P. Girard and A. Virazel and N. Badereddine},
  year = {2014},
  journal = {Journal of Electronic Testing},
  doi = {10.1007/s10836-014-5479-z},
  url = {https://doi.org/10.1007/s10836-014-5479-z}
}

RIS

TY  - JOUR
TI  - On the Test and Mitigation of Malfunctions in Low-Power SRAMs
AU  - L. H. Bonet Zordan
AU  - A. Bosio
AU  - L. Dilillo
AU  - P. Girard
AU  - A. Virazel
AU  - N. Badereddine
PY  - 2014
JO  - Journal of Electronic Testing
DO  - 10.1007/s10836-014-5479-z
UR  - https://doi.org/10.1007/s10836-014-5479-z
ER  -

APA

Zordan, L. H. B., Bosio, A., Dilillo, L., Girard, P., Virazel, A., & Badereddine, N. (2014). On the Test and Mitigation of Malfunctions in Low-Power SRAMs. Journal of Electronic Testing. https://doi.org/10.1007/s10836-014-5479-z

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crossref · retrieved 2026-11-10T15:12:23.325Z