Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range
- DOI
- 10.1007/s10836-015-5548-y
- Published
- 2015-11-13
- Container
- Journal of Electronic Testing
- Publisher
- Springer Science and Business Media LLC
- Open access
- unknown
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Cite this work
BibTeX
@article{allodium:10.1007/s10836-015-5548-y,
title = {Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range},
author = {Stéphane David-Grignot and Florence Azaïs and Laurent Latorre and François Lefevre},
year = {2015},
journal = {Journal of Electronic Testing},
doi = {10.1007/s10836-015-5548-y},
url = {https://doi.org/10.1007/s10836-015-5548-y}
}RIS
TY - JOUR TI - Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range AU - Stéphane David-Grignot AU - Florence Azaïs AU - Laurent Latorre AU - François Lefevre PY - 2015 JO - Journal of Electronic Testing DO - 10.1007/s10836-015-5548-y UR - https://doi.org/10.1007/s10836-015-5548-y ER -
APA
David-Grignot, S., Azaïs, F., Latorre, L., & Lefevre, F. (2015). Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range. Journal of Electronic Testing. https://doi.org/10.1007/s10836-015-5548-y
Source records
- crossref · retrieved 2026-09-26T03:57:45.819Z