Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications

Aibin Yan, Aoran Cao, Zhelong Xu, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen

Open source

DOI: 10.1007/s10836-021-05962-0
Published: 2021-08
Container: Journal of Electronic Testing
Publisher: Springer Science and Business Media LLC
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1007/s10836-021-05962-0,
  title = {Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications},
  author = {Aibin Yan and Aoran Cao and Zhelong Xu and Jie Cui and Tianming Ni and Patrick Girard and Xiaoqing Wen},
  year = {2021},
  journal = {Journal of Electronic Testing},
  doi = {10.1007/s10836-021-05962-0},
  url = {https://doi.org/10.1007/s10836-021-05962-0}
}

RIS

TY  - JOUR
TI  - Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications
AU  - Aibin Yan
AU  - Aoran Cao
AU  - Zhelong Xu
AU  - Jie Cui
AU  - Tianming Ni
AU  - Patrick Girard
AU  - Xiaoqing Wen
PY  - 2021
JO  - Journal of Electronic Testing
DO  - 10.1007/s10836-021-05962-0
UR  - https://doi.org/10.1007/s10836-021-05962-0
ER  -

APA

Yan, A., Cao, A., Xu, Z., Cui, J., Ni, T., Girard, P., & Wen, X. (2021). Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications. Journal of Electronic Testing. https://doi.org/10.1007/s10836-021-05962-0

Source records

crossref · retrieved 2026-09-26T01:46:21.225Z