Reducing Aging Impacts in Digital Sensors via Run-Time Calibration

Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi

DOI: 10.1007/s10836-021-05976-8
Published: 2021-12
Container: Journal of Electronic Testing: : Theory and Applications
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1007/s10836-021-05976-8,
  title = {Reducing Aging Impacts in Digital Sensors via Run-Time Calibration},
  author = {Md Toufiq Hasan Anik and Mohammad Ebrahimabadi and Jean-Luc Danger and Sylvain Guilley and Naghmeh Karimi},
  year = {2021},
  journal = {Journal of Electronic Testing: : Theory and Applications},
  doi = {10.1007/s10836-021-05976-8},
  url = {https://doi.org/10.1007/s10836-021-05976-8}
}

RIS

TY  - JOUR
TI  - Reducing Aging Impacts in Digital Sensors via Run-Time Calibration
AU  - Md Toufiq Hasan Anik
AU  - Mohammad Ebrahimabadi
AU  - Jean-Luc Danger
AU  - Sylvain Guilley
AU  - Naghmeh Karimi
PY  - 2021
JO  - Journal of Electronic Testing: : Theory and Applications
DO  - 10.1007/s10836-021-05976-8
UR  - https://doi.org/10.1007/s10836-021-05976-8
ER  -

APA

Anik, M. T. H., Ebrahimabadi, M., Danger, J., Guilley, S., & Karimi, N. (2021). Reducing Aging Impacts in Digital Sensors via Run-Time Calibration. Journal of Electronic Testing: : Theory and Applications. https://doi.org/10.1007/s10836-021-05976-8

Source records

hal · retrieved 2026-09-25T17:38:09.069Z