Electrical characterization of semiconductor materials and devices—review

M. J. Deen, F. Pascal

Open source

DOI: 10.1007/s10854-006-0001-8
Published: 2006-08
Container: Journal of Materials Science: Materials in Electronics
Publisher: Springer Science and Business Media LLC
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1007/s10854-006-0001-8,
  title = {Electrical characterization of semiconductor materials and devices—review},
  author = {M. J. Deen and F. Pascal},
  year = {2006},
  journal = {Journal of Materials Science: Materials in Electronics},
  doi = {10.1007/s10854-006-0001-8},
  url = {https://doi.org/10.1007/s10854-006-0001-8}
}

RIS

TY  - JOUR
TI  - Electrical characterization of semiconductor materials and devices—review
AU  - M. J. Deen
AU  - F. Pascal
PY  - 2006
JO  - Journal of Materials Science: Materials in Electronics
DO  - 10.1007/s10854-006-0001-8
UR  - https://doi.org/10.1007/s10854-006-0001-8
ER  -

APA

Deen, M. J., & Pascal, F. (2006). Electrical characterization of semiconductor materials and devices—review. Journal of Materials Science: Materials in Electronics. https://doi.org/10.1007/s10854-006-0001-8

Source records

crossref · retrieved 2026-09-26T05:49:08.510Z