RETRACTED ARTICLE: Comparison of the effect of Cr3+ substituted Co–Cu and Cu–Co nano ferrites on structural, magnetic, DC electrical resistivity, and dielectric properties
- DOI
- 10.1007/s10854-023-11808-6
- Published
- 2024-01
- Container
- Journal of Materials Science: Materials in Electronics
- Publisher
- Springer Science and Business Media LLC
- Open access
- unknown
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serious concern Score 29/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.
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Cite this work
BibTeX
@article{allodium:10.1007/s10854-023-11808-6,
title = {RETRACTED ARTICLE: Comparison of the effect of Cr3+ substituted Co–Cu and Cu–Co nano ferrites on structural, magnetic, DC electrical resistivity, and dielectric properties},
author = {B. Suryanarayana and P. V. S. K. Phanidhar Varma and P. S. V. Shanmukhi and M. Gnana Kiran and N. Murali and Tulu Wegayehu Mammo and Vemuri Raghavendra and D. Parajuli and Khalid Mujasam Batoo and Sajjad Hussain},
year = {2024},
journal = {Journal of Materials Science: Materials in Electronics},
doi = {10.1007/s10854-023-11808-6},
url = {https://doi.org/10.1007/s10854-023-11808-6}
}RIS
TY - JOUR TI - RETRACTED ARTICLE: Comparison of the effect of Cr3+ substituted Co–Cu and Cu–Co nano ferrites on structural, magnetic, DC electrical resistivity, and dielectric properties AU - B. Suryanarayana AU - P. V. S. K. Phanidhar Varma AU - P. S. V. Shanmukhi AU - M. Gnana Kiran AU - N. Murali AU - Tulu Wegayehu Mammo AU - Vemuri Raghavendra AU - D. Parajuli AU - Khalid Mujasam Batoo AU - Sajjad Hussain PY - 2024 JO - Journal of Materials Science: Materials in Electronics DO - 10.1007/s10854-023-11808-6 UR - https://doi.org/10.1007/s10854-023-11808-6 ER -
APA
Suryanarayana, B., Varma, P. V. S. K. P., Shanmukhi, P. S. V., Kiran, M. G., Murali, N., Mammo, T. W., Raghavendra, V., Parajuli, D., Batoo, K. M., & Hussain, S. (2024). RETRACTED ARTICLE: Comparison of the effect of Cr3+ substituted Co–Cu and Cu–Co nano ferrites on structural, magnetic, DC electrical resistivity, and dielectric properties. Journal of Materials Science: Materials in Electronics. https://doi.org/10.1007/s10854-023-11808-6
Source records
- crossref · retrieved 2026-09-26T06:41:21.997Z