RETRACTED ARTICLE: Capacitance pin defect detection based on deep learning

Cheng Cheng, Ning Dai, Jie Huang, Yahong Zhuang, Tao Tang, Longlong Liu

DOI: 10.1007/s10878-022-00904-8
Published: 2022-09-09
Container: Journal of Combinatorial Optimization
Publisher: Springer Science and Business Media LLC
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1007/s10878-022-00904-8,
  title = {RETRACTED ARTICLE: Capacitance pin defect detection based on deep learning},
  author = {Cheng Cheng and Ning Dai and Jie Huang and Yahong Zhuang and Tao Tang and Longlong Liu},
  year = {2022},
  journal = {Journal of Combinatorial Optimization},
  doi = {10.1007/s10878-022-00904-8},
  url = {https://doi.org/10.1007/s10878-022-00904-8}
}

RIS

TY  - JOUR
TI  - RETRACTED ARTICLE: Capacitance pin defect detection based on deep learning
AU  - Cheng Cheng
AU  - Ning Dai
AU  - Jie Huang
AU  - Yahong Zhuang
AU  - Tao Tang
AU  - Longlong Liu
PY  - 2022
JO  - Journal of Combinatorial Optimization
DO  - 10.1007/s10878-022-00904-8
UR  - https://doi.org/10.1007/s10878-022-00904-8
ER  -

APA

Cheng, C., Dai, N., Huang, J., Zhuang, Y., Tang, T., & Liu, L. (2022). RETRACTED ARTICLE: Capacitance pin defect detection based on deep learning. Journal of Combinatorial Optimization. https://doi.org/10.1007/s10878-022-00904-8

Source records

crossref · retrieved 2026-09-26T01:31:47.131Z