A 300-mK Test Bed for Rapid Characterization of Microwave SQUID Multiplexing Circuits.

Wessels AL, Becker DT, Bennett DA, Gard JD, Hubmayr J, Jarosik N, Kotsubo VY, Mates JAB, Ullom JN

Open source

DOI
10.1007/s10909-018-2048-3
Published
2018 Dec
Container
Journal of low temperature physics
Publisher
Not recorded
Open access
yes

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BibTeX

@article{allodium:10.1007/s10909-018-2048-3,
  title = {A 300-mK Test Bed for Rapid Characterization of Microwave SQUID Multiplexing Circuits.},
  author = {Wessels AL and Becker DT and Bennett DA and Gard JD and Hubmayr J and Jarosik N and Kotsubo VY and Mates JAB and Ullom JN},
  year = {2018},
  journal = {Journal of low temperature physics},
  doi = {10.1007/s10909-018-2048-3},
  url = {https://doi.org/10.1007/s10909-018-2048-3}
}

RIS

TY  - JOUR
TI  - A 300-mK Test Bed for Rapid Characterization of Microwave SQUID Multiplexing Circuits.
AU  - Wessels AL
AU  - Becker DT
AU  - Bennett DA
AU  - Gard JD
AU  - Hubmayr J
AU  - Jarosik N
AU  - Kotsubo VY
AU  - Mates JAB
AU  - Ullom JN
PY  - 2018
JO  - Journal of low temperature physics
DO  - 10.1007/s10909-018-2048-3
UR  - https://doi.org/10.1007/s10909-018-2048-3
ER  - 

APA

AL, W., DT, B., DA, B., JD, G., J, H., N, J., VY, K., JAB, M., & JN, U. (2018). A 300-mK Test Bed for Rapid Characterization of Microwave SQUID Multiplexing Circuits.. Journal of low temperature physics. https://doi.org/10.1007/s10909-018-2048-3

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