RETRACTED ARTICLE: Optoelectronic device based failure management using content based multispectral image retrieval and deep learning model

Raghuram Bhukya, B. Arunsundar, Narendra Babu Tatini, Triveni Mohan Sadala, Hashim Elshafie, Shamimul Qamar

DOI: 10.1007/s11082-023-05793-7
Published: 2023-12-27
Container: Optical and Quantum Electronics
Publisher: Springer Science and Business Media LLC
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1007/s11082-023-05793-7,
  title = {RETRACTED ARTICLE: Optoelectronic device based failure management using content based multispectral image retrieval and deep learning model},
  author = {Raghuram Bhukya and B. Arunsundar and Narendra Babu Tatini and Triveni Mohan Sadala and Hashim Elshafie and Shamimul Qamar},
  year = {2023},
  journal = {Optical and Quantum Electronics},
  doi = {10.1007/s11082-023-05793-7},
  url = {https://doi.org/10.1007/s11082-023-05793-7}
}

RIS

TY  - JOUR
TI  - RETRACTED ARTICLE: Optoelectronic device based failure management using content based multispectral image retrieval and deep learning model
AU  - Raghuram Bhukya
AU  - B. Arunsundar
AU  - Narendra Babu Tatini
AU  - Triveni Mohan Sadala
AU  - Hashim Elshafie
AU  - Shamimul Qamar
PY  - 2023
JO  - Optical and Quantum Electronics
DO  - 10.1007/s11082-023-05793-7
UR  - https://doi.org/10.1007/s11082-023-05793-7
ER  -

APA

Bhukya, R., Arunsundar, B., Tatini, N. B., Sadala, T. M., Elshafie, H., & Qamar, S. (2023). RETRACTED ARTICLE: Optoelectronic device based failure management using content based multispectral image retrieval and deep learning model. Optical and Quantum Electronics. https://doi.org/10.1007/s11082-023-05793-7

Source records

crossref · retrieved 2026-11-04T17:52:44.144Z