The Use of Atomic Force Microscopy to Study Crack Tips in Glass

Sheldon M. Wiederhorn, Jean-Pierre Guin, Theo Fett

Open source

DOI: 10.1007/s11661-010-0411-3
Published: 2010-12-07
Container: Metallurgical and Materials Transactions A
Publisher: Springer Science and Business Media LLC
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1007/s11661-010-0411-3,
  title = {The Use of Atomic Force Microscopy to Study Crack Tips in Glass},
  author = {Sheldon M. Wiederhorn and Jean-Pierre Guin and Theo Fett},
  year = {2010},
  journal = {Metallurgical and Materials Transactions A},
  doi = {10.1007/s11661-010-0411-3},
  url = {https://doi.org/10.1007/s11661-010-0411-3}
}

RIS

TY  - JOUR
TI  - The Use of Atomic Force Microscopy to Study Crack Tips in Glass
AU  - Sheldon M. Wiederhorn
AU  - Jean-Pierre Guin
AU  - Theo Fett
PY  - 2010
JO  - Metallurgical and Materials Transactions A
DO  - 10.1007/s11661-010-0411-3
UR  - https://doi.org/10.1007/s11661-010-0411-3
ER  -

APA

Wiederhorn, S. M., Guin, J., & Fett, T. (2010). The Use of Atomic Force Microscopy to Study Crack Tips in Glass. Metallurgical and Materials Transactions A. https://doi.org/10.1007/s11661-010-0411-3

Source records

crossref · retrieved 2026-11-10T12:01:19.171Z