RTS Noise Detection and Voltage Effect on RTS in HgCdTe Focal-Plane Arrays

Maxence Guénin, Sophie Derelle, Marcel Caes, Laurent Rubaldo, Isabelle Ribet-Mohamed

DOI: 10.1007/s11664-020-08271-y
Published: 2020-11
Container: Journal of Electronic Materials
Publisher: Not recorded
Open access: yes

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Cite this work

BibTeX

@article{allodium:10.1007/s11664-020-08271-y,
  title = {RTS Noise Detection and Voltage Effect on RTS in HgCdTe Focal-Plane Arrays},
  author = {Maxence Guénin and Sophie Derelle and Marcel Caes and Laurent Rubaldo and Isabelle Ribet-Mohamed},
  year = {2020},
  journal = {Journal of Electronic Materials},
  doi = {10.1007/s11664-020-08271-y},
  url = {https://doi.org/10.1007/s11664-020-08271-y}
}

RIS

TY  - JOUR
TI  - RTS Noise Detection and Voltage Effect on RTS in HgCdTe Focal-Plane Arrays
AU  - Maxence Guénin
AU  - Sophie Derelle
AU  - Marcel Caes
AU  - Laurent Rubaldo
AU  - Isabelle Ribet-Mohamed
PY  - 2020
JO  - Journal of Electronic Materials
DO  - 10.1007/s11664-020-08271-y
UR  - https://doi.org/10.1007/s11664-020-08271-y
ER  -

APA

Guénin, M., Derelle, S., Caes, M., Rubaldo, L., & Ribet-Mohamed, I. (2020). RTS Noise Detection and Voltage Effect on RTS in HgCdTe Focal-Plane Arrays. Journal of Electronic Materials. https://doi.org/10.1007/s11664-020-08271-y

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hal · retrieved 2026-11-10T11:26:29.108Z