Instance-Aware Pseudo-Labeling and Class-Focused Contrastive Learning for Weakly Supervised Domain Adaptive Segmentation of Electron Microscopy.

Xiong S, Chen J, Wang Y, Peng J

Open source

DOI
10.1007/s12021-026-09786-1
Published
2026 May 11
Container
Neuroinformatics
Publisher
Not recorded
Open access
no

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BibTeX

@article{allodium:10.1007/s12021-026-09786-1,
  title = {Instance-Aware Pseudo-Labeling and Class-Focused Contrastive Learning for Weakly Supervised Domain Adaptive Segmentation of Electron Microscopy.},
  author = {Xiong S and Chen J and Wang Y and Peng J},
  year = {2026},
  journal = {Neuroinformatics},
  doi = {10.1007/s12021-026-09786-1},
  url = {https://doi.org/10.1007/s12021-026-09786-1}
}

RIS

TY  - JOUR
TI  - Instance-Aware Pseudo-Labeling and Class-Focused Contrastive Learning for Weakly Supervised Domain Adaptive Segmentation of Electron Microscopy.
AU  - Xiong S
AU  - Chen J
AU  - Wang Y
AU  - Peng J
PY  - 2026
JO  - Neuroinformatics
DO  - 10.1007/s12021-026-09786-1
UR  - https://doi.org/10.1007/s12021-026-09786-1
ER  - 

APA

S, X., J, C., Y, W., & J, P. (2026). Instance-Aware Pseudo-Labeling and Class-Focused Contrastive Learning for Weakly Supervised Domain Adaptive Segmentation of Electron Microscopy.. Neuroinformatics. https://doi.org/10.1007/s12021-026-09786-1

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