VHEE beam parameter extraction from depth-dose and lateral profile measurements: a Monte Carlo parametric study

Mohammed Rezzoug, Yassine Oulhouq, Omar Hamzaoui, Mustapha Zerfaoui, Abdeslem Rrhioua, Dikra Bakari

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DOI: 10.1007/s12194-026-01160-9
Published: 2026-10-31
Container: Radiological Physics and Technology
Publisher: Springer Science and Business Media LLC
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1007/s12194-026-01160-9,
  title = {VHEE beam parameter extraction from depth-dose and lateral profile measurements: a Monte Carlo parametric study},
  author = {Mohammed Rezzoug and Yassine Oulhouq and Omar Hamzaoui and Mustapha Zerfaoui and Abdeslem Rrhioua and Dikra Bakari},
  year = {2026},
  journal = {Radiological Physics and Technology},
  doi = {10.1007/s12194-026-01160-9},
  url = {https://doi.org/10.1007/s12194-026-01160-9}
}

RIS

TY  - JOUR
TI  - VHEE beam parameter extraction from depth-dose and lateral profile measurements: a Monte Carlo parametric study
AU  - Mohammed Rezzoug
AU  - Yassine Oulhouq
AU  - Omar Hamzaoui
AU  - Mustapha Zerfaoui
AU  - Abdeslem Rrhioua
AU  - Dikra Bakari
PY  - 2026
JO  - Radiological Physics and Technology
DO  - 10.1007/s12194-026-01160-9
UR  - https://doi.org/10.1007/s12194-026-01160-9
ER  -

APA

Rezzoug, M., Oulhouq, Y., Hamzaoui, O., Zerfaoui, M., Rrhioua, A., & Bakari, D. (2026). VHEE beam parameter extraction from depth-dose and lateral profile measurements: a Monte Carlo parametric study. Radiological Physics and Technology. https://doi.org/10.1007/s12194-026-01160-9

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crossref · retrieved 2026-11-10T11:41:12.953Z