Diode area melting of Ti6Al4V: effects of multi-laser processing on microstructure and residual stress

Anqi Liang, Sarath Veetil, Kristian Groom, Kamran Mumtaz

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DOI: 10.1007/s40964-026-01951-x
Published: 2026-09-08
Container: Progress in Additive Manufacturing
Publisher: Springer Science and Business Media LLC
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1007/s40964-026-01951-x,
  title = {Diode area melting of Ti6Al4V: effects of multi-laser processing on microstructure and residual stress},
  author = {Anqi Liang and Sarath Veetil and Kristian Groom and Kamran Mumtaz},
  year = {2026},
  journal = {Progress in Additive Manufacturing},
  doi = {10.1007/s40964-026-01951-x},
  url = {https://doi.org/10.1007/s40964-026-01951-x}
}

RIS

TY  - JOUR
TI  - Diode area melting of Ti6Al4V: effects of multi-laser processing on microstructure and residual stress
AU  - Anqi Liang
AU  - Sarath Veetil
AU  - Kristian Groom
AU  - Kamran Mumtaz
PY  - 2026
JO  - Progress in Additive Manufacturing
DO  - 10.1007/s40964-026-01951-x
UR  - https://doi.org/10.1007/s40964-026-01951-x
ER  -

APA

Liang, A., Veetil, S., Groom, K., & Mumtaz, K. (2026). Diode area melting of Ti6Al4V: effects of multi-laser processing on microstructure and residual stress. Progress in Additive Manufacturing. https://doi.org/10.1007/s40964-026-01951-x

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crossref · retrieved 2026-11-10T10:09:38.610Z