Characterization of interfaces by photothermal methods

H.G. Walther, W. Karpen

Open source

DOI: 10.1016/0003-2670(93)e0484-o
Published: 1994-10
Container: Analytica Chimica Acta
Publisher: Elsevier BV
Open access: unknown

Credibility signals

uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

supportingDOI registered: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
supportingDOI resolves: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility. Source: DOAJ; license: CC0
not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredROR affiliation: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredOpen access status: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication license: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication version: A publication version was supplied but is not scored. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
supportingMetadata completeness: All 6 scored descriptive metadata groups are present. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer

Cite this work

BibTeX

@article{allodium:10.1016/0003-2670-93-e0484-o,
  title = {Characterization of interfaces by photothermal methods},
  author = {H.G. Walther and W. Karpen},
  year = {1994},
  journal = {Analytica Chimica Acta},
  doi = {10.1016/0003-2670(93)e0484-o},
  url = {https://doi.org/10.1016/0003-2670(93)e0484-o}
}

RIS

TY  - JOUR
TI  - Characterization of interfaces by photothermal methods
AU  - H.G. Walther
AU  - W. Karpen
PY  - 1994
JO  - Analytica Chimica Acta
DO  - 10.1016/0003-2670(93)e0484-o
UR  - https://doi.org/10.1016/0003-2670(93)e0484-o
ER  -

APA

Walther, H., & Karpen, W. (1994). Characterization of interfaces by photothermal methods. Analytica Chimica Acta. https://doi.org/10.1016/0003-2670(93)e0484-o

Source records

crossref · retrieved 2026-09-26T06:08:55.764Z