The well depths of XeF− and XeCl− from differential scattering measurements

C. De Vreugd, R.W. Wijnaendts Van Resandt, J. Los

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DOI: 10.1016/0009-2614(79)80134-7
Published: 1979-08
Container: Chemical Physics Letters
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/0009-2614-79-80134-7,
  title = {The well depths of XeF− and XeCl− from differential scattering measurements},
  author = {C. De Vreugd and R.W. Wijnaendts Van Resandt and J. Los},
  year = {1979},
  journal = {Chemical Physics Letters},
  doi = {10.1016/0009-2614(79)80134-7},
  url = {https://doi.org/10.1016/0009-2614(79)80134-7}
}

RIS

TY  - JOUR
TI  - The well depths of XeF− and XeCl− from differential scattering measurements
AU  - C. De Vreugd
AU  - R.W. Wijnaendts Van Resandt
AU  - J. Los
PY  - 1979
JO  - Chemical Physics Letters
DO  - 10.1016/0009-2614(79)80134-7
UR  - https://doi.org/10.1016/0009-2614(79)80134-7
ER  -

APA

Vreugd, C. D., Resandt, R. W. V., & Los, J. (1979). The well depths of XeF− and XeCl− from differential scattering measurements. Chemical Physics Letters. https://doi.org/10.1016/0009-2614(79)80134-7

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crossref · retrieved 2026-09-27T08:38:16.196Z