Dielectric breakdown II: Related projects at the University of twente

J.H. Klootwijk, J.F. Verweij, J.B. Rem, S. Bijlsma

Open source

DOI: 10.1016/0026-2692(95)00105-0
Published: 1996-10
Container: Microelectronics Journal
Publisher: Elsevier BV
Open access: unknown

Credibility signals

uncertain Score 64/100 under policy 1.0.0. This is a metadata assessment, not a judgment of the paper's conclusions.

Show all credibility signals

supportingDOI registered: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
supportingDOI resolves: A matching record was returned by Crossref. Source: Crossref; license: CC0 metadata
not scoredDirectory of Open Access Journals: No matching DOAJ record was present in this response. No allow-list match; this is not evidence of low credibility. Source: DOAJ; license: CC0
not scoredMEDLINE indexed: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredOpenAlex core source: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredKnown publisher allow-list: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredROR affiliation: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredRetraction Watch retraction: No retraction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch expression of concern: No expression of concern notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch correction: No correction notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredRetraction Watch reinstatement: No reinstatement notice matched this DOI in the deployed snapshot. No matching event found; coverage may be incomplete. Source: Retraction Watch; license: CC BY 4.0
not scoredOpen access status: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication license: Not checked or no result supplied; no credibility inference made. Source: No authority result supplied; license: Unknown
not scoredPublication version: A publication version was supplied but is not scored. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer
supportingMetadata completeness: All 6 scored descriptive metadata groups are present. Source: Normalized work metadata; license: Caller-provided; provenance license not supplied to scorer

Cite this work

BibTeX

@article{allodium:10.1016/0026-2692-95-00105-0,
  title = {Dielectric breakdown II: Related projects at the University of twente},
  author = {J.H. Klootwijk and J.F. Verweij and J.B. Rem and S. Bijlsma},
  year = {1996},
  journal = {Microelectronics Journal},
  doi = {10.1016/0026-2692(95)00105-0},
  url = {https://doi.org/10.1016/0026-2692(95)00105-0}
}

RIS

TY  - JOUR
TI  - Dielectric breakdown II: Related projects at the University of twente
AU  - J.H. Klootwijk
AU  - J.F. Verweij
AU  - J.B. Rem
AU  - S. Bijlsma
PY  - 1996
JO  - Microelectronics Journal
DO  - 10.1016/0026-2692(95)00105-0
UR  - https://doi.org/10.1016/0026-2692(95)00105-0
ER  -

APA

Klootwijk, J., Verweij, J., Rem, J., & Bijlsma, S. (1996). Dielectric breakdown II: Related projects at the University of twente. Microelectronics Journal. https://doi.org/10.1016/0026-2692(95)00105-0

Source records

crossref · retrieved 2026-09-27T14:05:40.625Z