Cost analysis, availability and MTTF of a three state standby complex system under common cause and human failures

D. Pandey, Mendus Jacob

Open source

DOI: 10.1016/0026-2714(93)e0019-6
Published: 1995-01
Container: Microelectronics Reliability
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/0026-2714-93-e0019-6,
  title = {Cost analysis, availability and MTTF of a three state standby complex system under common cause and human failures},
  author = {D. Pandey and Mendus Jacob},
  year = {1995},
  journal = {Microelectronics Reliability},
  doi = {10.1016/0026-2714(93)e0019-6},
  url = {https://doi.org/10.1016/0026-2714(93)e0019-6}
}

RIS

TY  - JOUR
TI  - Cost analysis, availability and MTTF of a three state standby complex system under common cause and human failures
AU  - D. Pandey
AU  - Mendus Jacob
PY  - 1995
JO  - Microelectronics Reliability
DO  - 10.1016/0026-2714(93)e0019-6
UR  - https://doi.org/10.1016/0026-2714(93)e0019-6
ER  -

APA

Pandey, D., & Jacob, M. (1995). Cost analysis, availability and MTTF of a three state standby complex system under common cause and human failures. Microelectronics Reliability. https://doi.org/10.1016/0026-2714(93)e0019-6

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crossref · retrieved 2026-09-26T13:36:33.233Z