FTIR spectroscopy and AES study of water containment in SiO2 thin films

A. Demšar, B. Colarič, S. Rus, J. Lindav, F. Švegelj, B. Orel, B. Praček, A. Zalar

Open source

DOI: 10.1016/0040-6090(96)08690-7
Published: 1996-08
Container: Thin Solid Films
Publisher: Elsevier BV
Open access: unknown

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Cite this work

BibTeX

@article{allodium:10.1016/0040-6090-96-08690-7,
  title = {FTIR spectroscopy and AES study of water containment in SiO2 thin films},
  author = {A. Demšar and B. Colarič and S. Rus and J. Lindav and F. Švegelj and B. Orel and B. Praček and A. Zalar},
  year = {1996},
  journal = {Thin Solid Films},
  doi = {10.1016/0040-6090(96)08690-7},
  url = {https://doi.org/10.1016/0040-6090(96)08690-7}
}

RIS

TY  - JOUR
TI  - FTIR spectroscopy and AES study of water containment in SiO2 thin films
AU  - A. Demšar
AU  - B. Colarič
AU  - S. Rus
AU  - J. Lindav
AU  - F. Švegelj
AU  - B. Orel
AU  - B. Praček
AU  - A. Zalar
PY  - 1996
JO  - Thin Solid Films
DO  - 10.1016/0040-6090(96)08690-7
UR  - https://doi.org/10.1016/0040-6090(96)08690-7
ER  -

APA

Demšar, A., Colarič, B., Rus, S., Lindav, J., Švegelj, F., Orel, B., Praček, B., & Zalar, A. (1996). FTIR spectroscopy and AES study of water containment in SiO2 thin films. Thin Solid Films. https://doi.org/10.1016/0040-6090(96)08690-7

Source records

crossref · retrieved 2026-11-10T21:00:39.551Z